Cranfield University Public Equipment Register

XRD D5005 N=1 (X-ray Diffraction)

Can be used to study the crystal structure of materials including orientation, composition and residual stress.

TESCAN VEGA 3 Scanning Electron Microscope

Tescan VEGA 3 Scanning electron microscope (SEM) located in the Microscopy Services Centre at Cranfield University. General purpose Tungsten Filament SEM equipped with a large sample chamber, secondary electron and backscattered electron imaging, plus an Oxford Instruments Energy Dispersive X-Ray Spectroscopy (EDS) system for elemental analysis. Low vacuum 'Uni-vac' mode is also available for non-conductive samples (please note we're not able to analyse wet samples with Uni-vac mode).

TESCAN S8000G Scanning Electron Microscope

Tescan S8000 Dual Beam FIB-SEM located in the Microscopy Services Centre at Cranfield University. High resolution FEG-SEM with Ga FIB equipped with a large sample chamber, secondary electron and backscattered electron imaging, plus an Oxford Instruments Energy Dispersive X-Ray Spectroscopy (EDS) system for elemental analysis. Also capable of Focus Ion Beam milling for in-situ cross-sectioning and TEM lamella preparation and rapid EBSD analysis with an Oxford Instruments Symmetry S1 EBSD detector.

TESCAN VEGA 4 Scanning Electron Microscope

Tescan VEGA 4 Scanning electron microscope (SEM) located in the Microscopy Services Centre at Cranfield University. General purpose Tungsten Filament SEM equipped with secondary electron and backscattered electron imaging, plus an Oxford Instruments Energy Dispersive X-Ray Spectroscopy (EDS) system for elemental analysis. Low vacuum 'Uni-vac' mode is also available for non-conductive samples (please note we're not able to analyse wet samples with Uni-vac mode).

Atomic Force Microscope (AFM)

Atomic Force Microscope located in B39 G36. Can provide high resolution imaging of topographical features and phase as well as force deflection curves.

TESCAN Solaris X Scanning Electron Microscope

Tescan Solaris X Dual Beam Plasma FIB-SEM with TOFSIMS located in the Microscopy Services Centre at Cranfield University. High resolution FEG-SEM with Xenon Plasma FIB equipped with a large sample chamber, secondary electron and backscattered electron imaging, immersion lens imaging for very high resolution, plus a Bruker Energy Dispersive X-Ray Spectroscopy (EDS) system for elemental analysis. Also capable of Focus Ion Beam milling for in-situ cross-sectioning and TOFSIMS for depth profiling and sensitive compositional analysis (including light elements such as Lithium). A Bruker EBSD system is also available.